Result(s) for Wafer Carriers: OnBid

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Search Result(s) for Wafer Carriers

19 Opportunities Found 1 2 Next

Bid Title	Country
Summary	Country
Bid Date
Single Crystal GaN Substrates	USA
...single crystal semiconductor wafers according to specification ...arcsec, or better 2. Wafer bow 10 m, or ...or smaller 7. High-carrier concentration	USA
Posted Date: Mar 09, 2012 Bid Date: Mar 29, 2012
ASIC - Strobed Analog Comparator	USA
...they own the wafer masks that are ...in conformance with carrier requirements, delivery and	USA
Posted Date: Aug 18, 2011 Bid Date: Sep 02, 2011
Dual Module Resistivity and Mobility Measurement System	USA
...electrical properties of wafers preparatory to device ...with precision motorized wafer handler. - All computer/...Measurements must include carrier mobility, sheet	USA
Posted Date: Jul 18, 2011 Bid Date: Jul 26, 2011
D-Reutlingen: laboratory, optical and precision equipments (excl. glasses)	Germany
...and chill modules. Carriers should be able ...substrates (glass, silicon wafers, polymer foils), processes	Germany
Posted Date: May 14, 2011 Bid Date: Jun 17, 2011
Gold Pellets	USA
...surface of silicon wafers in the processing ...of the silicon wafer in order to ...in conformance with carrier requirements, deliver the	USA
Posted Date: Apr 19, 2011 Bid Date: Apr 22, 2011
Core Wafer WLR Software Tools	USA
...toolset with Core Wafer Systems PDQ-WLR ...migration (EM), Hot Carrier Injection (HCI)/Plasma,	USA
Posted Date: Jul 16, 2010 Bid Date: Jul 26, 2010
GASB Substrates	USA
...to award to Wafer Technology LTD, on ...Doped N-Type GASB Wafers, with Orientation (100) +/- 0.1 ...Orientation (100) +/- 0.1 degree, Carrier Conc./cm-3, (1-10)	USA
Posted Date: Jun 29, 2010 Bid Date: Jul 21, 2010
Investigation of Optical Properties of Black Si	USA
...contact measurements of carrier concentration and ...tasks. (7) Purchase 5 SOI wafers from SOITEC. (8) Provide	USA
Posted Date: Jun 02, 2010 Bid Date: Jun 10, 2010
The National Institute of Standards and Technology is seeking to purchase a Critical Dimension (CD) measuring microscope.	USA
...100mm and 150mm wafers. Stage shall also ...in conformance with carrier requirements, deliver the	USA
Posted Date: Jun 02, 2010 Bid Date: Jun 02, 2010
Materials Testing Machine	USA
...precise measurements of wafer bond strength. It ...in conformance with carrier requirements, deliver the	USA
Posted Date: May 26, 2010 Bid Date: Jun 01, 2010