International Bid Contractor
| Bid Title | Country |
|---|---|
| Summary | |
| Bid Date | |
| Single Crystal GaN Substrates | ![]() USA |
| ...single crystal semiconductor wafers according to specification ...arcsec, or better 2. Wafer bow 10 m, or ...or smaller 7. High-carrier concentration | |
| Posted Date: Mar 09, 2012 Bid Date: Mar 29, 2012 | |
| ASIC - Strobed Analog Comparator | ![]() USA |
| ...they own the wafer masks that are ...in conformance with carrier requirements, delivery and | |
| Posted Date: Aug 18, 2011 Bid Date: Sep 02, 2011 | |
| Dual Module Resistivity and Mobility Measurement System | ![]() USA |
| ...electrical properties of wafers preparatory to device ...with precision motorized wafer handler. - All computer/...Measurements must include carrier mobility, sheet | |
| Posted Date: Jul 18, 2011 Bid Date: Jul 26, 2011 | |
| D-Reutlingen: laboratory, optical and precision equipments (excl. glasses) | ![]() Germany |
| ...and chill modules. Carriers should be able ...substrates (glass, silicon wafers, polymer foils), processes | |
| Posted Date: May 14, 2011 Bid Date: Jun 17, 2011 | |
| Gold Pellets | ![]() USA |
| ...surface of silicon wafers in the processing ...of the silicon wafer in order to ...in conformance with carrier requirements, deliver the | |
| Posted Date: Apr 19, 2011 Bid Date: Apr 22, 2011 | |
| Core Wafer WLR Software Tools | ![]() USA |
| ...toolset with Core Wafer Systems PDQ-WLR ...migration (EM), Hot Carrier Injection (HCI)/Plasma, | |
| Posted Date: Jul 16, 2010 Bid Date: Jul 26, 2010 | |
| GASB Substrates | ![]() USA |
| ...to award to Wafer Technology LTD, on ...Doped N-Type GASB Wafers, with Orientation (100) +/- 0.1 ...Orientation (100) +/- 0.1 degree, Carrier Conc./cm-3, (1-10) | |
| Posted Date: Jun 29, 2010 Bid Date: Jul 21, 2010 | |
| Investigation of Optical Properties of Black Si | ![]() USA |
| ...contact measurements of carrier concentration and ...tasks. (7) Purchase 5 SOI wafers from SOITEC. (8) Provide | |
| Posted Date: Jun 02, 2010 Bid Date: Jun 10, 2010 | |
| The National Institute of Standards and Technology is seeking to purchase a Critical Dimension (CD) measuring microscope. | ![]() USA |
| ...100mm and 150mm wafers. Stage shall also ...in conformance with carrier requirements, deliver the | |
| Posted Date: Jun 02, 2010 Bid Date: Jun 02, 2010 | |
| Materials Testing Machine | ![]() USA |
| ...precise measurements of wafer bond strength. It ...in conformance with carrier requirements, deliver the | |
| Posted Date: May 26, 2010 Bid Date: Jun 01, 2010 | |
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